Electron Microscopes


JEOL JIB-4500 Multi Beam System

JEOL Jib-4500 Multi beam system

  • LaB6 emitter; Acceleration voltage 0.3 to 30,000 V
  • Focused Ion Beam (FIB) resolution :5 nm at 30 keV
  • Scanning Electron Microscope (SEM) resolution : 2.5 nm at 30 keV
  • Pressure range in low-vacuum mode: 1,10 to 100 Pa
  • Gas Injection System (GIS) – allows ion-beam deposition of C and W
  • X-Ray Energy-Dispersive Spectrometer (EDS) – EDAX APOLLO XV
  • EDS resolution, 128 eV measured at MnK, 100,000CPS
  • Omniprobe, OMP-AUTOPROBE 200.1 Nanomanipulator
  • Remote access capabilities


JEOL 2100 Scanning Transmission Electron Microscope

JEOL 2100 Scanning/transmission electron microscope

Instrument features and capabilities:

  • Accelerating Voltage up to 200,000 Volts
  • Magnification Range ´200 to ´1,500,000
  • ~0.20 nm Point-to-Point Resolution; 0.14 nm Lattice Resolution
  • Energy Dispersive X-Ray Detector (with Light Element Detection Capability) for Quantitative Analysis

  • High Resolution (~0.30 nm) Chemical Profile Mapping in Scanning Mode

  • Digital Camera System Enabling Capture of Both High Resolution Images and Electron Diffraction Patterns

  • Remote Access Capability via Knobset Interface Box or Software Only


JEOL JSM-7600F Scanning Electron Microscope

JEOL JSM-7600F Scanning Electron Microscope

  • SEI resolution: 1.5 nm (1 kV) in GB mode, 1.0 nm (15 kV)
  • Magnification: 25 to 1,000,000x
  • Accelerating voltage: 0.1 to 30 kV
  • Beam current : 1 pA to 200 nA at 15 kV
  • Detector: Upper and lower detectors
  • Scanning Transmission Electron Microscopy (STEM) mode
  • BS, EDS, EBSD, NPGS systems available


JEOL JSM-IT300LV Variable Pressure SEM

JEOL JSM-IT300LV Variable Pressure SEM

  • Extended vacuum range from 10 Pa to 650 Pa
  • Accelerating Voltage: 300v to 30kV
  • Magnification: 5x to 300,000x
  • Resolution: high vacuum model 3.0nm at 30kV; low vacuum model 4.0 nm at 30kV.
  • Large analytical chamber and specimen stage can support samples as large as 300mm in diameter
  • New intuitive multi-touch software interface
  • High resolution imaging with tungsten source
  • Mechanically eucentric 5-axis motorized stage with asynchronous movement
  • Navigation from a color image built in
  • Multiple Live Imaging (including Picture in Picture and signal mixing)
  • Video capture built in (AVI format)

Youngstown State University STEM Electron Microscopy Scheduluer
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